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Using reliability growth to aid qualification testing: follow a real product through MIL-STD-810E testing to see how reliability growth contributes to a successful design

Authors :
Mullineaux, Thomas
Source :
EE-Evaluation Engineering. June 2005, Vol. 44 Issue 6, p48, 5 p.
Publication Year :
2005

Abstract

Despite the continuing push for commercial off the shelf (COTS) items, many products still are designed from their inception to be flight qualified. When the intended platform is a fighter [...]

Details

Language :
English
ISSN :
01490370
Volume :
44
Issue :
6
Database :
Gale General OneFile
Journal :
EE-Evaluation Engineering
Publication Type :
Periodical
Accession number :
edsgcl.133516835