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Microscopes offer modular solution for industrial inspection
- Source :
- Product News Network. June 24, 2005
- Publication Year :
- 2005
-
Abstract
- Eclipse LV Series accommodates sample heights from 47-82 mm by inserting column riser between main body and arm. First order compensator, UV polarizing, and epi-fluorescence techniques are available as well […]
Details
- Language :
- English
- Database :
- Gale General OneFile
- Journal :
- Product News Network
- Publication Type :
- Periodical
- Accession number :
- edsgcl.133514297