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Microbeam high-resolution x-ray diffraction in strained InGaAlAs-based multiple quantum well laser structures grown selectively on masked InP substrates

Authors :
Sirenko, A.A.
Kazimirov, A.
R. Huang
Bilderback, D.H.
O'Malley, S.
Gupta, V.
Bacher, K.
Detelsen, L.J.P.
Ougazzaden, A.
Source :
Journal of Applied Physics. March 15, 2005, Vol. 97 Issue 6, p063512-1, 7 p.
Publication Year :
2005

Abstract

A study is carried out on the structural and optical properties of the InGaAlAs-based multiple quantum well (MQW) 1.3 micrometer laser structures produced on InP (001) substrates by metal organic vapor phase epitaxy (MOVPE) technique in the regime of selective area growth (SAG). The results obtained from the study helps in determining the optimal SAG mask parameters for the growth of integrated InGaAlAs-based optoelectronic light-emitting components and devices.

Details

Language :
English
ISSN :
00218979
Volume :
97
Issue :
6
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.132835158