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Optical analysis of nanocrystalline thin layers deposited by the ion layer gas reaction method

Authors :
Muffler, H.J.
Muller, F.
Lux-Steiner, M.C.
Fischer, Ch.H.
Source :
Journal of Applied Physics. Jan 1, 2005, Vol. 97 Issue 1, p014310-1, 6 p.
Publication Year :
2005

Abstract

A study is conducted on nanocrystalline ZnS thin layers that are prepared by ion layer gas reaction. Details of the investigations done on the nanocrystalline ZnS thin layers by optical spectroscopy, x-ray fluorescence and energy dispersive x-ray analysis are discussed.

Details

Language :
English
ISSN :
00218979
Volume :
97
Issue :
1
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.131928766