Transient response of III-V field-effect transistors to heavy-ion irradiation

The single-event effects response of three different III-V field-effect transistor technologies (GaAs MESFET, InAIAs/InGaAs HEMT, and AISb/InAs HEMT) is measured for MeV and GeV heavy-ion irradiation. These measurements reveal significant charge enhancement and very slow, microsecond-timescale relaxation times for the GaAs and InAIAs/InGaAs devices, with a much faster recovery from the ionizing event observed for the AISb/InAs HEMTs. Index Terms--AISb, charge collection, GaAs, HEMT, InAIAs, InAs, InGaAs, InP, MESFET, single-event transient, single-event upset.