Mechanisms of limitation and nature of field dependence of critical current in HTS epitaxial YBaCuO films

Authors :: Pan, Vladimir M.
Pashitskii, Ernst A.
Ryabchenko, Sergey M.
Komashko, Valentin A.
Semenov, Alexey V.
Pan, Alexey V.
Dou, S.X.
Tretiatchenko, Constantin G.
Fedotov, Yuri V.
Source :: IEEE Transactions on Applied Superconductivity. June, 2003, Vol. 13 Issue 2, p3714, 4 p.
Publication Year :: 2003
Abstract: Investigating the mechanisms of limitation and nature of field dependence of critical current in HTS epitaxial YBaCuO films is discussed. The developed model takes into account a statistical distribution of the dislocation domain boundaries ordered in a network as well as the interdislocation spacing within boundaries.

Subjects :: Dielectric films -- Analysis
Thin films -- Analysis
Electric currents -- Observations
High temperature superconductors -- Research
Business
Electronics
Electronics and electrical industries

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