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Design of film surface roughness-minimizing molecular beam epitaxy process by reduced-order of epitaxial growth

Authors :
Gallivan, Martha A.
Atwater, Harry A.
Source :
Journal of Applied Physics. Jan 15, 2004, Vol. 95 Issue 2, p483, 7 p.
Publication Year :
2004

Abstract

Molecular beam epitaxy of germanium is used along with kinetic Monte Carlo simulations to study time-varying processing parameters and their effect on surface morphology. The study presented is an initial demonstration of a general approach that can be used to optimize properties in other materials and deposition processes.

Details

Language :
English
ISSN :
00218979
Volume :
95
Issue :
2
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.124934103