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Substrate noise-coupling characterization and efficient suppression in CMOS technology
- Source :
- IEEE Transactions on Electron Devices. May, 2004, Vol. 51 Issue 5, p817, 3 p.
- Publication Year :
- 2004
-
Abstract
- The substrate noise coupling using S-parameters measurement is investigated. It is indicated that the noise coupling can be efficiently diminished by incorporating guard ring (GR) and deep n-well (DNW) structures.
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 51
- Issue :
- 5
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.123802314