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Strain gradients along the growth direction in thin diamond film deposited on silicon wafer
- Source :
- Journal of Applied Physics. July 1, 2003, Vol. 94 Issue 1, 136-139
- Publication Year :
- 2003
-
Abstract
- The variation of strain, sp(sup 2) hybridized carbon combination and defect density through the thickness by micro-Raman scattering and microphotoluninescence spectroscopy is evaluated. The results are correlated with curvature observations on detached films, which reflect through thickness strain gradients in the films.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 94
- Issue :
- 1
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.123346569