Sputtered stoichmetric TeO2 glass films: dispersion of linear and nonlinear optical properties

Authors :: D'Amore, Franco
Rigato, Valentino
Giulio, Massimo
Martinelli, Mario
Pietralunga, Silvia M
Zapettini, Andrea
Nasi, Lucia
Source :: Journal of Applied Physics. August 1, 2003, Vol. 94 Issue 3, 1654-1661
Publication Year :: 2003
Abstract: The production and optical characterization of samples of stoichiometric TeO2 glass thin films, grown by reactive sputtering from Te targets are discussed. The analysis has proved to suitable to realize films of good optical quality in the micrometer thickness range.

Subjects :: Tellurium -- Research
Tellurium -- Optical properties
Dielectric films -- Research
Dielectric films -- Optical properties
Thin films -- Research
Thin films -- Optical properties
Sputtering (Physics) -- Research
Physics

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