Microstructure study of amorphous vanadium oxide thin films using Raman spectroscopy

Authors :: Se-Hee Lee
Hyeonsik M. Cheong
Maeng Je Seong
Ping Liu
Tracy, C. Edwin
Mascarenhas, Angelo
Pitts, J. Ronald
Deb, Satyen K.
Source :: Journal of Applied Physics. August 15, 2002, Vol. 92 Issue 4, 1893-1897
Publication Year :: 2002
Abstract: The Raman-scattering measurements were used to study the microstructural changes of amorphous V2O5 films with lithium intercalation. The result shows two broad peaks around at 520 and 650 cm(super -1), due to the stretching modes of the V3-O and V2-O bonds respectively.

Subjects :: Vanadium pentoxide -- Research
Vanadium pentoxide -- Properties
Dielectric films -- Research
Dielectric films -- Properties
Thin films -- Research
Thin films -- Properties
Lithium -- Usage
Raman effect -- Analysis
Physics

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