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Fabrication and characterization of metal-semiconductor field-effect-transistor-type quantum devices
- Source :
- Journal of Applied Physics. July 1, 2004, Vol. 96 Issue 1, 704-708
- Publication Year :
- 2004
-
Abstract
- A quantum dot transistors (QDT) and a nanowire transistor from a metal-semiconductor field-effect-transistors (MESFET)-type GaAs wafer was fabricated and characterized at low temperatures. The nanodevices showed a quantum mechanical effect like scanning electron microscope (SET) through excited states and negative differentail resistance (NDR).
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 96
- Issue :
- 1
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.122433213