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Diagnostic and analytical study on a low-pressure limit of diamond chemical vapor deposition in inductively coupled CO-CH(sub 4)-H(sub 2) plasmas
- Source :
- Journal of Applied Physics. April 15, 2004, Vol. 95 Issue 8, 4463-4470
- Publication Year :
- 2004
-
Abstract
- Plasma diagnostics and kinetic rate analysis for radicals is used for studying the role of neutral radicals and charged ions in a low pressure limit diamond chemical vapor deposition in CO-CH(sub 4)-H(sub 2) plasmas, which are coupled inductively. The results show radical fluxes limit the nucleation and modify the dynamic effects of energetic ions.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 95
- Issue :
- 8
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.121832958