Scattering matrix approach to the resonant states and Q values of microdisk lasing cavities

We develop a scattering matrix approach for the numerical calculation of resonant states and Q values of a nonideal optical disk cavity with an arbitrary shape and with an arbitrary varying refraction index. The developed method is applied to study the effect of surface roughness and inhomogeneity of the refraction index on Q values of micredisk cavities for lasing applications. We demonstrate that even small surface roughness ([DELTA]r [less than or equal to] [lambda]/50) can lead to a drastic degradation of high-Q cavity modes by many orders of magnitude. The results of the numerical simulation are analyzed and explained in terms of wave reflection at a curved dielectric interface, combined with an examination of Poincare surfaces of section and of Husimi distributions. OCIS codes: 140.4780, 140.3410, 290.4020, 290.5880, 230.5750.