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Efficient test access mechanism optimization for system-on-chip
- Source :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. May, 2003, Vol. 22 Issue 5, p635, 8 p.
- Publication Year :
- 2003
Details
- Language :
- English
- ISSN :
- 02780070
- Volume :
- 22
- Issue :
- 5
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.104565741