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Defects-Recognition, Imaging and Physics in Semiconductors XIV

Authors :
Hiroshi Yamada-Kaneta
Akira Sakai
Hiroshi Yamada-Kaneta
Akira Sakai
Publication Year :
2012

Abstract

Selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP-14), September 25-29, 2011, Miyazaki, Japan

Subjects

Subjects :
Semiconductors--Defects--Congresses
Image processing--Congresses

Details

Language :
English
ISBNs :
9783037854426 and 9783038138563
Volume :
00725
Database :
eBook Index
Journal :
Defects-Recognition, Imaging and Physics in Semiconductors XIV
Publication Type :
eBook
Accession number :
517215

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