Characterisation and Control of Defects in Semiconductors

MLA

Filip Tuomisto. Characterisation and Control of Defects in Semiconductors. The Institution of Engineering and Technology, 2019. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsebk&AN=2345949&authtype=sso&custid=ns315887.

APA

Filip Tuomisto. (2019). Characterisation and Control of Defects in Semiconductors. The Institution of Engineering and Technology.

Chicago

Filip Tuomisto. 2019. Characterisation and Control of Defects in Semiconductors. IET Materials, Circuits & Devices Series. Stevenage: The Institution of Engineering and Technology. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsebk&AN=2345949&authtype=sso&custid=ns315887.