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Advancing Silicon Carbide Electronics Technology I : Metal Contacts to Silicon Carbide: Physics, Technology, Applications

Authors :
Zekentes, Konstantinos
Vasilevskiy, Konstantin V.
Zekentes, Konstantinos
Vasilevskiy, Konstantin V.
Publication Year :
2018

Abstract

The rapidly advancing Silicon Carbide technology has demonstrated a great potential in high-power low-loss semiconductor electronics. High thermal stability and outstanding chemical inertness make SiC an excellent material for development of high temperature electronics and semiconductor devices operating in harsh environment. Keywords: Silicon Carbide Technology, Semiconductor Devices, SiC Device Fabrication, SiC Device Characterization, SiC Surface Cleaning, SiC Surface Etching, Electrical Characterization of SiC, Ohmic Contacts to SiC, Contact Resistivity Analysis, Ohmic Contact Fabrication, Metallization Schemes, Thermal Stability of Ohmic Contacts to SiC, Schottky Contacts to SiC, Schottky Barrier Formation, Schottky Diodes, Junction Barrier Schottky Diodes, Si/ SiC Heterojunction Diodes, Schottky Barrier Inhomogeneity in SiC, SiC Power Electronics, Temperature/Light Sensors, SiC Switching Devices, High Temperature Electronics, High Frequency Electronics, Thermal Stability of SiC.

Details

Language :
English
ISBNs :
9781945291845 and 9781945291852
Volume :
00037
Database :
eBook Index
Journal :
Advancing Silicon Carbide Electronics Technology I : Metal Contacts to Silicon Carbide: Physics, Technology, Applications
Publication Type :
eBook
Accession number :
1881480