Two Methods for the Exact Solution of Diffraction Problems

In analyses of radiation scattering, accurately assessing the shape of the scatterer and the wavelength of the incident radiation is a goal that has challenged researchers since the beginning of optical science. This innovative text presents two methods of calculating the electromagnetic fields due to radiation scattering by a single scatterer. Both methods yield valid results for all wavelengths of the incident radiation as well as a wide variety of scatterer configurations.