Measurement Technology for Micro-Nanometer Devices

MLA

Wendong Zhang, et al. Measurement Technology for Micro-Nanometer Devices. Wiley, 2017. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsebk&AN=1399096&authtype=sso&custid=ns315887.

APA

Wendong Zhang, Xiujian Chou, Tielin Shi, Zongmin Ma, Haifei Bao, Jingdong Chen, Liguo Chen, Dachao Li, & Chenyang Xue. (2017). Measurement Technology for Micro-Nanometer Devices. Wiley.

Chicago

Wendong Zhang, Xiujian Chou, Tielin Shi, Zongmin Ma, Haifei Bao, Jingdong Chen, Liguo Chen, Dachao Li, and Chenyang Xue. 2017. Measurement Technology for Micro-Nanometer Devices. Solaris South Tower, Singapore: Wiley. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsebk&AN=1399096&authtype=sso&custid=ns315887.