Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case

MLA

Daniel Ebeling, and Santiago D. Solares. “Bimodal Atomic Force Microscopy Driving the Higher Eigenmode in Frequency-Modulation Mode: Implementation, Advantages, Disadvantages and Comparison to the Open-Loop Case.” Beilstein Journal of Nanotechnology, vol. 4, no. 1, Mar. 2013, pp. 198–207. EBSCOhost, https://doi.org/10.3762/bjnano.4.20.

APA

Daniel Ebeling, & Santiago D. Solares. (2013). Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case. Beilstein Journal of Nanotechnology, 4(1), 198–207. https://doi.org/10.3762/bjnano.4.20

Chicago

Daniel Ebeling, and Santiago D. Solares. 2013. “Bimodal Atomic Force Microscopy Driving the Higher Eigenmode in Frequency-Modulation Mode: Implementation, Advantages, Disadvantages and Comparison to the Open-Loop Case.” Beilstein Journal of Nanotechnology 4 (1): 198–207. doi:10.3762/bjnano.4.20.