Cite
Monitoring chip-branches failure of multichip IGBT module using change rate of gate voltage
MLA
Kaihong Wang, et al. “Monitoring Chip-Branches Failure of Multichip IGBT Module Using Change Rate of Gate Voltage.” Energy Reports, vol. 9, no. 646–655, Sept. 2023, pp. 646–55. EBSCOhost, https://doi.org/10.1016/j.egyr.2023.04.107.
APA
Kaihong Wang, Yanjin Yan, Jihong Zhao, Yidi Zhu, & Longsheng Zhang. (2023). Monitoring chip-branches failure of multichip IGBT module using change rate of gate voltage. Energy Reports, 9(646–655), 646–655. https://doi.org/10.1016/j.egyr.2023.04.107
Chicago
Kaihong Wang, Yanjin Yan, Jihong Zhao, Yidi Zhu, and Longsheng Zhang. 2023. “Monitoring Chip-Branches Failure of Multichip IGBT Module Using Change Rate of Gate Voltage.” Energy Reports 9 (646–655): 646–55. doi:10.1016/j.egyr.2023.04.107.