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Reciprocal space slicing: A time-efficient approach to femtosecond x-ray diffraction

Authors :
S. P. Zeuschner
M. Mattern
J.-E. Pudell
A. von Reppert
M. Rössle
W. Leitenberger
J. Schwarzkopf
J. E. Boschker
M. Herzog
M. Bargheer
Source :
Structural Dynamics, Vol 8, Iss 1, Pp 014302-014302-10 (2021)
Publication Year :
2021
Publisher :
AIP Publishing LLC and ACA, 2021.

Abstract

An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measurement geometry with a position-sensitive detector. This means that neither the incident (ω) nor the exit ( 2 θ) diffraction angle is scanned during the strain assessment via x-ray diffraction. Shifts of diffraction peaks on the fixed x-ray area detector originate from an out-of-plane strain within the sample. Quantitative strain assessment requires the determination of a factor relating the observed shift to the change in the reciprocal lattice vector. The factor depends only on the widths of the peak along certain directions in reciprocal space, the diffraction angle of the studied reflection, and the resolution of the instrumental setup. We provide a full theoretical explanation and exemplify the concept with picosecond strain dynamics of a thin layer of NbO2.

Subjects

Subjects :
Crystallography
QD901-999

Details

Language :
English
ISSN :
23297778
Volume :
8
Issue :
1
Database :
Directory of Open Access Journals
Journal :
Structural Dynamics
Publication Type :
Academic Journal
Accession number :
edsdoj.f474185c79dd4de8930e8272a041e625
Document Type :
article
Full Text :
https://doi.org/10.1063/4.0000040