Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses

MLA

Zhikang Yang, et al. “Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses.” Journal of Electromagnetic Engineering and Science, vol. 24, no. 2, Mar. 2024, pp. 151–60. EBSCOhost, https://doi.org/10.26866/jees.2024.2.r.215.

APA

Zhikang Yang, Lin Wen, Yudong Li, Dong Zhou, Xin Wang, Rui Ding, Meiqing Zhong, Cui Meng, Wenxiao Fang, & Qi Guo. (2024). Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses. Journal of Electromagnetic Engineering and Science, 24(2), 151–160. https://doi.org/10.26866/jees.2024.2.r.215

Chicago

Zhikang Yang, Lin Wen, Yudong Li, Dong Zhou, Xin Wang, Rui Ding, Meiqing Zhong, Cui Meng, Wenxiao Fang, and Qi Guo. 2024. “Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses.” Journal of Electromagnetic Engineering and Science 24 (2): 151–60. doi:10.26866/jees.2024.2.r.215.