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Corrosion‐Resistant Ultrathin Cu Film Deposited on N‐Doped Amorphous Carbon Film Substrate and Its Use for Crumpleable Circuit Board

Authors :
Chae‐Eun Shim
Sangseob Lee
Minsik Kong
Ik‐Soo Kim
Jaeik Kwak
Woosun Jang
Se‐Young Jeong
Dong Wook Kim
Aloysius Soon
Unyong Jeong
Source :
Advanced Science, Vol 11, Iss 40, Pp n/a-n/a (2024)
Publication Year :
2024
Publisher :
Wiley, 2024.

Abstract

Abstract Copper (Cu) is widely used as an industrial electrode due to its high electrical conductivity, mechanical properties, and cost‐effectiveness. However, Cu is susceptible to corrosion, which degrades device performance over time. Although various methods (alloying, physical passivation, surface treatment, etc.) are introduced to address the corrosion issue, they can cause decreased conductivity or vertical insulation. Here, using the nitrogen‐doped amorphous carbon (a‐C:N) thin film is proposed as a substrate on which Cu is directly deposited. This simple method significantly inhibits corrosion of ultrathin Cu (

Details

Language :
English
ISSN :
21983844
Volume :
11
Issue :
40
Database :
Directory of Open Access Journals
Journal :
Advanced Science
Publication Type :
Academic Journal
Accession number :
edsdoj.ba4ffa5e114dbdb3eea26b1ede9d73
Document Type :
article
Full Text :
https://doi.org/10.1002/advs.202403587