Back to Search
Start Over
Binary Radio Tomographic Imaging in Factory Environments Based on LOS/NLOS Identification
- Source :
- IEEE Access, Vol 11, Pp 22418-22429 (2023)
- Publication Year :
- 2023
- Publisher :
- IEEE, 2023.
-
Abstract
- Radio tomographic imaging (RTI) is a technique for estimating spatial loss fields (SLFs), which maps the quantified attenuation of radio signals at every spatial location within monitored regions. In this study, we investigate RTI techniques in indoor factory environments, where the RTI techniques deteriorate because of severe multipath channels. We propose the binary radio tomographic imaging (binary RTI) method, where the attenuation level of each pixel in a SLF is defined as a binary value. The binary RTI method is suited for factory environments, including metallic objects, because radio signals are almost fully reflected rather than getting absorbed by such objects. In the proposed method, we suppose that transmitted signals are modulated with an orthogonal frequency division multiplexing (OFDM) format, and each receiver is equipped with multiple antenna elements. By adopting the two-dimensional multiple signal classification (MUSIC), the proposed method identifies whether the signals are transmitted in a line-of-sight (LOS) or a non-line-of-sight (NLOS) path. From the LOS/NLOS identification, we propose two algorithms to estimate the binary SLF: a simple greedy algorithm and a relaxation algorithm with low-rank approximation. We evaluate the performance of the proposed method via simulation experiments. To assess the applicability of the proposed method to factory environments, we assume a severe multipath environment where all the objects, wall, and ceiling are perfect electrical conductors, and show that by using an appropriate threshold parameter for the LOS/NLOS identification, the proposed method can estimate the binary SLF in the test environment.
Details
- Language :
- English
- ISSN :
- 21693536
- Volume :
- 11
- Database :
- Directory of Open Access Journals
- Journal :
- IEEE Access
- Publication Type :
- Academic Journal
- Accession number :
- edsdoj.b6390e31bdda450097fb36cedb44b17d
- Document Type :
- article
- Full Text :
- https://doi.org/10.1109/ACCESS.2023.3252568