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Sheet Resistance Reduction of MoS₂ Film Using Sputtering and Chlorine Plasma Treatment Followed by Sulfur Vapor Annealing

Authors :
Takuya Hamada
Shigetaka Tomiya
Tetsuya Tatsumi
Masaya Hamada
Taiga Horiguchi
Kuniyuki Kakushima
Kazuo Tsutsui
Hitoshi Wakabayashi
Source :
IEEE Journal of the Electron Devices Society, Vol 9, Pp 278-285 (2021)
Publication Year :
2021
Publisher :
IEEE, 2021.

Abstract

Sheet resistance (Rsheet) reduction of a-few-layered molybdenum disulfide (MoS2) film using sputtering is investigated in this study. To enhance the carrier density, chlorine (Cl2) gas excited by inductively coupled plasma is introduced as a substitute for sulfur. To electrically activate the Cl dopants and simultaneously prevent out-diffusion of sulfur, a furnace annealing was performed in sulfur-vapor ambient. Consequently, the Rsheet in the MoS2 film with the Cl2 plasma treatment remarkably reduced by one order lower than that without one, because of the activation of Cl dopants in the MoS2 film.

Details

Language :
English
ISSN :
21686734
Volume :
9
Database :
Directory of Open Access Journals
Journal :
IEEE Journal of the Electron Devices Society
Publication Type :
Academic Journal
Accession number :
edsdoj.b330459f5684d7a8f71012dc822f8c8
Document Type :
article
Full Text :
https://doi.org/10.1109/JEDS.2021.3050801