Potential yield simulated by global gridded crop models: using a process-based emulator to explain their differences

MLA

B. Ringeval, et al. “Potential Yield Simulated by Global Gridded Crop Models: Using a Process-Based Emulator to Explain Their Differences.” Geoscientific Model Development, vol. 14, Mar. 2021, pp. 1639–56. EBSCOhost, https://doi.org/10.5194/gmd-14-1639-2021.

APA

B. Ringeval, C. Müller, T. A. M. Pugh, N. D. Mueller, P. Ciais, C. Folberth, W. Liu, P. Debaeke, & S. Pellerin. (2021). Potential yield simulated by global gridded crop models: using a process-based emulator to explain their differences. Geoscientific Model Development, 14, 1639–1656. https://doi.org/10.5194/gmd-14-1639-2021

Chicago

B. Ringeval, C. Müller, T. A. M. Pugh, N. D. Mueller, P. Ciais, C. Folberth, W. Liu, P. Debaeke, and S. Pellerin. 2021. “Potential Yield Simulated by Global Gridded Crop Models: Using a Process-Based Emulator to Explain Their Differences.” Geoscientific Model Development 14 (March): 1639–56. doi:10.5194/gmd-14-1639-2021.