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Van der Waals engineering of ferroelectric heterostructures for long-retention memory

Authors :
Xiaowei Wang
Chao Zhu
Ya Deng
Ruihuan Duan
Jieqiong Chen
Qingsheng Zeng
Jiadong Zhou
Qundong Fu
Lu You
Song Liu
James H. Edgar
Peng Yu
Zheng Liu
Source :
Nature Communications, Vol 12, Iss 1, Pp 1-8 (2021)
Publication Year :
2021
Publisher :
Nature Portfolio, 2021.

Abstract

The memory retention for a ferroelectric field-effect transistor is limited by the depolarization effects and carrier charge trapping. Here, the authors fabricate a long-retention memory cell with a metal-ferroelectric-metal-insulator-semiconductor architecture built from all van der Waals single crystals.

Subjects

Subjects :
Science

Details

Language :
English
ISSN :
20411723
Volume :
12
Issue :
1
Database :
Directory of Open Access Journals
Journal :
Nature Communications
Publication Type :
Academic Journal
Accession number :
edsdoj.9ad4d3622c3f4336850233ae14c3daa3
Document Type :
article
Full Text :
https://doi.org/10.1038/s41467-021-21320-2