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Theoretical and Empirical Comparison of Electrical Properties of Porous Silicon
- Source :
- Science Journal of University of Zakho, Vol 1, Iss 2, Pp 874-881 (2013)
- Publication Year :
- 2013
- Publisher :
- University of Zakho, 2013.
-
Abstract
- The present work is the study of the dark current density for porous silicon which is prepared by photo-electrochemical etching for n-type silicon by using laser power density of (10mw/cm2)and wavelength(650nm) under different anodization time(50,60)minute. ,The results obtained from this study shows different characteristics that of porous for the different porous Silicon layers. The empirical data of J-V characteristics are compared by using mathematical(a Poole-Frenkel-like, Schottky diode) models prepared the with assistance of Matlab program.
Details
- Language :
- English
- ISSN :
- 2663628X and 26636298
- Volume :
- 1
- Issue :
- 2
- Database :
- Directory of Open Access Journals
- Journal :
- Science Journal of University of Zakho
- Publication Type :
- Academic Journal
- Accession number :
- edsdoj.96f046ccaf4d453b87eeb3306a1015fe
- Document Type :
- article