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Theoretical and Empirical Comparison of Electrical Properties of Porous Silicon

Authors :
Ahmed Kh. AL-Kadumi
Alwan M. Alwan
Ali H. Al-Batat
Source :
Science Journal of University of Zakho, Vol 1, Iss 2, Pp 874-881 (2013)
Publication Year :
2013
Publisher :
University of Zakho, 2013.

Abstract

The present work is the study of the dark current density for porous silicon which is prepared by photo-electrochemical etching for n-type silicon by using laser power density of (10mw/cm2)and wavelength(650nm) under different anodization time(50,60)minute. ,The results obtained from this study shows different characteristics that of porous for the different porous Silicon layers. The empirical data of J-V characteristics are compared by using mathematical(a Poole-Frenkel-like, Schottky diode) models prepared the with assistance of Matlab program.

Subjects

Subjects :
The
Science

Details

Language :
English
ISSN :
2663628X and 26636298
Volume :
1
Issue :
2
Database :
Directory of Open Access Journals
Journal :
Science Journal of University of Zakho
Publication Type :
Academic Journal
Accession number :
edsdoj.96f046ccaf4d453b87eeb3306a1015fe
Document Type :
article