Distress related to psychotic experiences: Enhancing the world health organization composite international diagnostic interview psychosis screen

MLA

Hans Oh, et al. “Distress Related to Psychotic Experiences: Enhancing the World Health Organization Composite International Diagnostic Interview Psychosis Screen.” International Journal of Methods in Psychiatric Research, vol. 33, no. 1, Mar. 2024. EBSCOhost, https://doi.org/10.1002/mpr.1977.

APA

Hans Oh, Nicole R. Karcher, Nirit Soffer‐Dudek, Ai Koyanagi, Megan Besecker, & Jordan E. DeVylder. (2024). Distress related to psychotic experiences: Enhancing the world health organization composite international diagnostic interview psychosis screen. International Journal of Methods in Psychiatric Research, 33(1). https://doi.org/10.1002/mpr.1977

Chicago

Hans Oh, Nicole R. Karcher, Nirit Soffer‐Dudek, Ai Koyanagi, Megan Besecker, and Jordan E. DeVylder. 2024. “Distress Related to Psychotic Experiences: Enhancing the World Health Organization Composite International Diagnostic Interview Psychosis Screen.” International Journal of Methods in Psychiatric Research 33 (1). doi:10.1002/mpr.1977.