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Fusion and fission of genes define a metric between fungal genomes.

Authors :
Pascal Durrens
Macha Nikolski
David Sherman
Source :
PLoS Computational Biology, Vol 4, Iss 10, p e1000200 (2008)
Publication Year :
2008
Publisher :
Public Library of Science (PLoS), 2008.

Abstract

Gene fusion and fission events are key mechanisms in the evolution of gene architecture, whose effects are visible in protein architecture when they occur in coding sequences. Until now, the detection of fusion and fission events has been performed at the level of protein sequences with a post facto removal of supernumerary links due to paralogy, and often did not include looking for events defined only in single genomes. We propose a method for the detection of these events, defined on groups of paralogs to compensate for the gene redundancy of eukaryotic genomes, and apply it to the proteomes of 12 fungal species. We collected an inventory of 1,680 elementary fusion and fission events. In half the cases, both composite and element genes are found in the same species. Per-species counts of events correlate with the species genome size, suggesting a random mechanism of occurrence. Some biological functions of the genes involved in fusion and fission events are slightly over- or under-represented. As already noted in previous studies, the genes involved in an event tend to belong to the same functional category. We inferred the position of each event in the evolution tree of the 12 fungal species. The event localization counts for all the segments of the tree provide a metric that depicts the "recombinational" phylogeny among fungi. A possible interpretation of this metric as distance in adaptation space is proposed.

Subjects

Subjects :
Biology (General)
QH301-705.5

Details

Language :
English
ISSN :
1553734X and 15537358
Volume :
4
Issue :
10
Database :
Directory of Open Access Journals
Journal :
PLoS Computational Biology
Publication Type :
Academic Journal
Accession number :
edsdoj.8bdc9b22e0eb4534be54a045134f9d9b
Document Type :
article
Full Text :
https://doi.org/10.1371/journal.pcbi.1000200