Back to Search Start Over

Measuring system for testing electrical parameters of EMCCDs of various formats

Authors :
Zabudsky V.
Golenkov O.
Rikhalsky O.
Reva V.
Korinets S.
Dukhnin S.
Mytiai R.
Source :
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 5-6, Pp 3-7 (2019)
Publication Year :
2019
Publisher :
Politehperiodika, 2019.

Abstract

This article describes the developed equipment that allows measuring the photoelectrical parameters of multielement photodetectors, specifically various formats of EMCCD (electron multiplying charge-coupled device) chips. The authors present the measuring techniques and test results on dark currents, output amplifier sensitivity, charge transfer efficiency, charge capacity and other parameters. The studies were conducted, both on the wafer and in the body, on samples of the following formats: 576×288, 640×512, 768×576, 1024×1024, and 1280×1024.

Details

Language :
English, Russian
ISSN :
22255818 and 23099992
Issue :
5-6
Database :
Directory of Open Access Journals
Journal :
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
Publication Type :
Academic Journal
Accession number :
edsdoj.7208e4e58c4210bb20449b8b7c26d7
Document Type :
article
Full Text :
https://doi.org/10.15222/TKEA2019.5-6.03