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Far-Field Super-Resolution Microscopy Using Evanescent Illumination: A Review

Authors :
Qianwei Zhang
Haonan Zhang
Xiaoyu Yang
Xu Liu
Mingwei Tang
Qing Yang
Source :
Photonics, Vol 11, Iss 6, p 528 (2024)
Publication Year :
2024
Publisher :
MDPI AG, 2024.

Abstract

The resolution of conventional optical microscopy is restricted by the diffraction limit. Light waves containing higher-frequency information about the sample are bound to the sample surface and cannot be collected by far-field optical microscopy. To break the resolution limit, researchers have proposed various far-field super-resolution (SR) microscopy imaging methods using evanescent waves to transfer the high-frequency information of samples to the low-frequency passband of optical microscopy. Optimization algorithms are developed to reconstruct a SR image of the sample by utilizing the high-frequency information. These techniques can be collectively referred to as spatial-frequency-shift (SFS) SR microscopy. This review aims to summarize the basic principle of SR microscopy using evanescent illumination and introduce the advances in this research area. Some current challenges and possible directions are also discussed.

Details

Language :
English
ISSN :
23046732
Volume :
11
Issue :
6
Database :
Directory of Open Access Journals
Journal :
Photonics
Publication Type :
Academic Journal
Accession number :
edsdoj.71edf7a4f77a4d5887044674245f7286
Document Type :
article
Full Text :
https://doi.org/10.3390/photonics11060528