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FEI Titan G2 60-300 HOLO

Authors :
Chris Boothroyd
András Kovács
Karsten Tillmann
Source :
Journal of large-scale research facilities JLSRF, Vol 2, p A44 (2016)
Publication Year :
2016
Publisher :
Forschungszentrum Jülich, 2016.

Abstract

The FEI Titan G2 60-300 HOLO is a unique fourth generation transmission electron microscope, which has been specifically designed for the investigation of electromagnetic fields of materials using off-axis electron holography. It has a Lorentz lens to allow magnetic field free imaging plus two electron biprisms, which in combination enable more uniform holographic fringes to be used. The instrument also has an ultra-wide objective lens pole piece gap which is ideal for in situ experiments. For these purposes, the FEI Titan G2 60-300 HOLO is equipped with a Schottky type high-brightness electron gun (FEI X-FEG), an image Cs corrector (CEOS), a post-column energy filter system (Gatan Tridiem 865 ER) as well as a 4 megapixel CCD system (Gatan UltraScan 1000 XP). Typical examples of use and technical specifications for the instrument are given below.

Subjects

Subjects :
Technology

Details

Language :
English
ISSN :
2364091X
Volume :
2
Database :
Directory of Open Access Journals
Journal :
Journal of large-scale research facilities JLSRF
Publication Type :
Academic Journal
Accession number :
edsdoj.6327b31ef471431eb2a2ca5695e714ab
Document Type :
article
Full Text :
https://doi.org/10.17815/jlsrf-2-70