Sparse-View Artifact Correction of High-Pixel-Number Synchrotron Radiation CT

High-pixel-number synchrotron radiation computed tomography (CT) has the advantages of high sensitivity, high resolution, and a large field of view. It has been widely used in biomedicine, cultural heritage research, non-destructive testing, and other fields. The Nyquist sampling theorem states that when the detector’s pixels per row are increased, it requires more CT projections, resulting in a lengthened CT scan time and increased radiation damage. Sparse-view CT can significantly reduce radiation damage and improve the projection data acquisition speed. However, there is insufficient sparse projection data, and the slices reconstructed show aliasing artifacts. Currently, aliasing artifact correction processes more medical CT images, and the number of pixels of such images is small (mainly 512×512 pixels). This paper presents an aliasing artifact correction algorithm based on deep learning for synchrotron radiation CT with a high pixel number (1728×1728 pixels). This method crops high-pixel-number CT images with aliasing artifacts into patches with overlapping features. During the network training process, a convolutional neural network is utilized to enhance the details of the patches, after which the patches are reintegrated into a new CT slice. Subsequently, the network parameters are updated to optimize the new CT slice that closely approximates the full-view slice. To align with practical application requirements, the neural network is trained using only three samples to optimize network parameters and applied successfully to untrained samples for aliasing artifact correction. Comparative analysis with typical deep learning aliasing artifact correction algorithms demonstrates the superior ability of our method to correct aliasing artifacts while preserving image details more effectively. Furthermore, the effect of aliasing artifact correction at varying levels of projection sparsity is investigated, revealing a positive correlation between image quality after deep learning processing and the number of projections. However, the trade-off between rapid experimentation and artifact correction remains a critical consideration.