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Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics
- Source :
- Materials, Vol 14, Iss 11, p 3056 (2021)
- Publication Year :
- 2021
- Publisher :
- MDPI AG, 2021.
-
Abstract
- The process of preparation of nanostructured thin films in high vacuum can be monitored with the help of reflection high energy diffraction (RHEED). However, RHEED patterns, both observed or recorded, need to be interpreted. The simplest approaches are based on carrying out the Ewald construction for a set of rods perpendicular to the crystal surface. This article describes how the utilization of computer graphics may be useful for realistic reproduction of experimental conditions, and then for carrying out the Ewald construction in a reciprocal 3D space. The computer software was prepared in the Java programing language. The software can be used to interpret real diffractions patterns for relatively flat surfaces, and thus it may be helpful in broad research practice.
- Subjects :
- nanostructured materials
kinematical diffraction theory
Ewald construction
computer visualization
Technology
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
Engineering (General). Civil engineering (General)
TA1-2040
Microscopy
QH201-278.5
Descriptive and experimental mechanics
QC120-168.85
Subjects
Details
- Language :
- English
- ISSN :
- 19961944
- Volume :
- 14
- Issue :
- 11
- Database :
- Directory of Open Access Journals
- Journal :
- Materials
- Publication Type :
- Academic Journal
- Accession number :
- edsdoj.5b87baaed1e84d32b3ec8645cdae1b25
- Document Type :
- article
- Full Text :
- https://doi.org/10.3390/ma14113056