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Dynamic probe of ZnTe(110) surface by scanning tunneling microscopy

Authors :
Ken Kanazawa
Shoji Yoshida
Hidemi Shigekawa
Shinji Kuroda
Source :
Science and Technology of Advanced Materials, Vol 16, Iss 1 (2015)
Publication Year :
2015
Publisher :
Taylor & Francis Group, 2015.

Abstract

The reconstructed surface structure of the II–VI semiconductor ZnTe (110), which is a promising material in the research field of semiconductor spintronics, was studied by scanning tunneling microscopy/spectroscopy (STM/STS). First, the surface states formed by reconstruction by the charge transfer of dangling bond electrons from cationic Zn to anionic Te atoms, which are similar to those of IV and III–V semiconductors, were confirmed in real space. Secondly, oscillation in tunneling current between binary states, which is considered to reflect a conformational change in the topmost Zn–Te structure between the reconstructed and bulk-like ideal structures, was directly observed by STM. Third, using the technique of charge injection, a surface atomic structure was successfully fabricated, suggesting the possibility of atomic-scale manipulation of this widely applicable surface of ZnTe.

Details

Language :
English
ISSN :
14686996 and 18785514
Volume :
16
Issue :
1
Database :
Directory of Open Access Journals
Journal :
Science and Technology of Advanced Materials
Publication Type :
Academic Journal
Accession number :
edsdoj.59844a537ebe4e98ae2e7cfb67ac3e73
Document Type :
article
Full Text :
https://doi.org/10.1088/1468-6996/16/1/015002