Optical Properties of TiO2 Grown by Atomic Layer Deposition Using Various Oxidizing Agents: The Ellipsometry Analysis of Absorption Properties

MLA

Jorge Luis Vazquez‐Arce, et al. “Optical Properties of TiO2 Grown by Atomic Layer Deposition Using Various Oxidizing Agents: The Ellipsometry Analysis of Absorption Properties.” Advanced Materials Interfaces, vol. 11, no. 26, Sept. 2024. EBSCOhost, https://doi.org/10.1002/admi.202400269.

APA

Jorge Luis Vazquez‐Arce, Tibor Suta, Bálint Fodor, László Makai, Oscar Contreras, Amin Bahrami, Kornelius Nielsch, & Hugo Tiznado. (2024). Optical Properties of TiO2 Grown by Atomic Layer Deposition Using Various Oxidizing Agents: The Ellipsometry Analysis of Absorption Properties. Advanced Materials Interfaces, 11(26). https://doi.org/10.1002/admi.202400269

Chicago

Jorge Luis Vazquez‐Arce, Tibor Suta, Bálint Fodor, László Makai, Oscar Contreras, Amin Bahrami, Kornelius Nielsch, and Hugo Tiznado. 2024. “Optical Properties of TiO2 Grown by Atomic Layer Deposition Using Various Oxidizing Agents: The Ellipsometry Analysis of Absorption Properties.” Advanced Materials Interfaces 11 (26). doi:10.1002/admi.202400269.