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CD 150 - short wheat cultivar with high quality and high yield

Authors :
Ivan Schuster
Edson Feliciano de Oliveira
Tatiane Dalla Nora
Volmir Sergio Marchioro
Francisco de Assis Franco
Elisa Serra Negra Vieira
Ademar Alves Sobrinho
Adriel Evangelista
Source :
Crop Breeding and Applied Biotechnology, Vol 11, Iss 2, Pp 186-188 (2011)
Publication Year :
2011
Publisher :
Brazilian Society of Plant Breeding, 2011.

Abstract

The industrial quality and lodging resistance of CD 150, a cross between CD104 and CD108, are high and the plant heightis short. The average yield was 10 % higher than of the controls in the regions II, III and IV. It is suitable for cultivation in the states of PR,SP, MS and GO, MG, and DF.

Details

Language :
English
ISSN :
15187853 and 19847033
Volume :
11
Issue :
2
Database :
Directory of Open Access Journals
Journal :
Crop Breeding and Applied Biotechnology
Publication Type :
Academic Journal
Accession number :
edsdoj.59776086101a4e6f8b654e779543dc51
Document Type :
article