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First-Principles Approach to Finite Element Simulation of Flexible Photovoltaics

Authors :
Francis Ako Marley
Joseph Asare
Daniel Sekyi-Arthur
Tino Lukas
Augustine Nana Sekyi Appiah
Dennis Charway
Benjamin Agyei-Tuffour
Richard Boadi
Patryk Janasik
Samuel Yeboah
G. Gebreyesus
George Nkrumah-Buandoh
Marcin Adamiak
Henry James Snaith
Source :
Energies, Vol 17, Iss 16, p 4064 (2024)
Publication Year :
2024
Publisher :
MDPI AG, 2024.

Abstract

This study explores the potential of copper-doped nickel oxide (Cu:NiO) as a hole transport layer (HTL) in flexible photovoltaic (PV) devices using a combined first-principles and finite element analysis approach. Density functional theory (DFT) calculations reveal that Cu doping introduces additional states in the valence band of NiO, leading to enhanced charge transport. Notably, Cu:NiO exhibits a direct band gap (reduced from 3.04 eV in NiO to 1.65 eV in the stable supercell structure), facilitating the efficient hole transfer from the active layer. Furthermore, the Fermi level shifts towards the valence band in Cu:NiO, promoting hole mobility. This translates to an improved photovoltaic performance, with Cu:NiO-based HTLs achieving ~18% and ~9% power conversion efficiencies (PCEs) in perovskite and poly 3-hexylthiophene: 1-3-methoxycarbonyl propyl-1-phenyl 6,6 C 61 butyric acid methyl ester (P3HT:PCBM) polymer solar cells, respectively. Finally, a finite element analysis demonstrates the potential of these composite HTLs with Poly 3,4-ethylene dioxythiophene)—polystyrene sulfonate (PEDOT:PSS) in flexible electronics design and the optimization of printing processes. Overall, this work highlights Cu:NiO as a promising candidate for high-performance and flexible organic–inorganic photovoltaic cells.

Details

Language :
English
ISSN :
19961073
Volume :
17
Issue :
16
Database :
Directory of Open Access Journals
Journal :
Energies
Publication Type :
Academic Journal
Accession number :
edsdoj.5775af30208940ecb304654bed3f8b30
Document Type :
article
Full Text :
https://doi.org/10.3390/en17164064