ROUGHNESS STUDY OF PAPER MADE FROM SECONDARY RAW MATERIALS BY ATOMIC FORCE MICROSCOPY

The paper considers the issues of high-precision parameter control of the produced paper products with secondary raw materials as a component. A method of atomic force microscopy is proposed for paper roughness study. Visualization of the obtained topographic images of each type of paper surface under study was performed with the use of a Solver HV scanning probe microscope; the average roughness of the height differences for each type of paper was determined. The results were compared with the state standard requirements and international recommendations. It is shown that applying of scanning probe microscopy makes it possible to carry out parameter express control of the cellulose paper products during their production. With the roughness express analysis by atomic force microscopy it might become possible to control purposefully the technological process and create the new types of paper products with specified properties that provide graphic printing accuracy without loss of small image details.