Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy

MLA

Owoong Kwon, et al. “Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy.” Advanced Science, vol. 7, no. 17, Sept. 2020. EBSCOhost, https://doi.org/10.1002/advs.201901391.

APA

Owoong Kwon, Daehee Seol, Huimin Qiao, & Yunseok Kim. (2020). Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy. Advanced Science, 7(17). https://doi.org/10.1002/advs.201901391

Chicago

Owoong Kwon, Daehee Seol, Huimin Qiao, and Yunseok Kim. 2020. “Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy.” Advanced Science 7 (17). doi:10.1002/advs.201901391.