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Critical evaluation of the reliability of DNA methylation probes on the Illumina MethylationEPIC v1.0 BeadChip microarrays

Authors :
Wei Zhang
Juan I. Young
Lissette Gomez
Michael A. Schmidt
David Lukacsovich
Achintya Varma
X. Steven Chen
Brian Kunkle
Eden R. Martin
Lily Wang
Source :
Epigenetics, Vol 19, Iss 1 (2024)
Publication Year :
2024
Publisher :
Taylor & Francis Group, 2024.

Abstract

DNA methylation (DNAm) plays a crucial role in a number of complex diseases. However, the reliability of DNAm levels measured using Illumina arrays varies across different probes. Previous research primarily assessed probe reliability by comparing duplicate samples between the 450k-450k or 450k-EPIC platforms, with limited investigations on Illumina EPIC v1.0 arrays. We conducted a comprehensive assessment of the EPIC v1.0 array probe reliability using 69 blood DNA samples, each measured twice, generated by the Alzheimer’s Disease Neuroimaging Initiative study. We observed higher reliability in probes with average methylation beta values of 0.2 to 0.8, and lower reliability in type I probes or those within the promoter and CpG island regions. Importantly, we found that probe reliability has significant implications in the analyses of Epigenome-wide Association Studies (EWAS). Higher reliability is associated with more consistent effect sizes in different studies, the identification of differentially methylated regions (DMRs) and methylation quantitative trait locus (mQTLs), and significant correlations with downstream gene expression. Moreover, blood DNAm measurements obtained from probes with higher reliability are more likely to show concordance with brain DNAm measurements. Our findings, which provide crucial reliability information for probes on the EPIC v1.0 array, will serve as a valuable resource for future DNAm studies.

Details

Language :
English
ISSN :
15592294 and 15592308
Volume :
19
Issue :
1
Database :
Directory of Open Access Journals
Journal :
Epigenetics
Publication Type :
Academic Journal
Accession number :
edsdoj.4ce06caaeaea44738879447256113558
Document Type :
article
Full Text :
https://doi.org/10.1080/15592294.2024.2333660