Cite
Day-to-Day Test-Retest Reliability of EEG Profiles in Children With Autism Spectrum Disorder and Typical Development
MLA
April R. Levin, et al. “Day-to-Day Test-Retest Reliability of EEG Profiles in Children With Autism Spectrum Disorder and Typical Development.” Frontiers in Integrative Neuroscience, vol. 14, Apr. 2020. EBSCOhost, https://doi.org/10.3389/fnint.2020.00021.
APA
April R. Levin, Adam J. Naples, Aaron Wolfe Scheffler, Sara J. Webb, Frederick Shic, Catherine A. Sugar, Michael Murias, Raphael A. Bernier, Katarzyna Chawarska, Geraldine Dawson, Susan Faja, Shafali Jeste, Charles A. Nelson, James C. McPartland, Damla Şentürk, & and the Autism Biomarkers Consortium for Clinical Trials. (2020). Day-to-Day Test-Retest Reliability of EEG Profiles in Children With Autism Spectrum Disorder and Typical Development. Frontiers in Integrative Neuroscience, 14. https://doi.org/10.3389/fnint.2020.00021
Chicago
April R. Levin, Adam J. Naples, Aaron Wolfe Scheffler, Sara J. Webb, Frederick Shic, Catherine A. Sugar, Michael Murias, et al. 2020. “Day-to-Day Test-Retest Reliability of EEG Profiles in Children With Autism Spectrum Disorder and Typical Development.” Frontiers in Integrative Neuroscience 14 (April). doi:10.3389/fnint.2020.00021.