Cite
Investigation of noise in surface topography measurement using structured illumination microscopy
MLA
Zhen Li, and Sophie Gröger. “Investigation of Noise in Surface Topography Measurement Using Structured Illumination Microscopy.” Metrology and Measurement Systems, vol. . 28, no. 4, Dec. 2021, pp. 767–79. EBSCOhost, https://doi.org/10.24425/mms.2021.137706.
APA
Zhen Li, & Sophie Gröger. (2021). Investigation of noise in surface topography measurement using structured illumination microscopy. Metrology and Measurement Systems, . 28(4), 767–779. https://doi.org/10.24425/mms.2021.137706
Chicago
Zhen Li, and Sophie Gröger. 2021. “Investigation of Noise in Surface Topography Measurement Using Structured Illumination Microscopy.” Metrology and Measurement Systems . 28 (4): 767–79. doi:10.24425/mms.2021.137706.