An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

MLA

Santiago H. Andany, et al. “An Atomic Force Microscope Integrated with a Helium Ion Microscope for Correlative Nanoscale Characterization.” Beilstein Journal of Nanotechnology, vol. 11, no. 1, Aug. 2020, pp. 1272–79. EBSCOhost, https://doi.org/10.3762/bjnano.11.111.

APA

Santiago H. Andany, Gregor Hlawacek, Stefan Hummel, Charlène Brillard, Mustafa Kangül, & Georg E. Fantner. (2020). An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization. Beilstein Journal of Nanotechnology, 11(1), 1272–1279. https://doi.org/10.3762/bjnano.11.111

Chicago

Santiago H. Andany, Gregor Hlawacek, Stefan Hummel, Charlène Brillard, Mustafa Kangül, and Georg E. Fantner. 2020. “An Atomic Force Microscope Integrated with a Helium Ion Microscope for Correlative Nanoscale Characterization.” Beilstein Journal of Nanotechnology 11 (1): 1272–79. doi:10.3762/bjnano.11.111.