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Toward Deep-Learning-Based Methods in Image Forgery Detection: A Survey

Authors :
Nam Thanh Pham
Chun-Su Park
Source :
IEEE Access, Vol 11, Pp 11224-11237 (2023)
Publication Year :
2023
Publisher :
IEEE, 2023.

Abstract

In the last decades, deep learning (DL) has emerged as a powerful and dominant technique for solving challenging problems in various fields. Likewise, in the field of digital image forensics, a large and growing body of literature investigates DL-based techniques for detecting and classifying tampered regions in images. This article aims to provides a comprehensive survey of state-of-the-art DL-based methods for image-forgery detection. Copy-move images and spliced images, two of the most popular types of forged images, were considered. Recently, owing to advances in DL, DL-based approaches have yielded much better results as compared to traditional non-DL-based ones. The surveyed techniques were proposed by developing or fusing various efficient DL methods, such as CNN, RCNN, or LSTM to adapt to detecting tampered traces.

Details

Language :
English
ISSN :
21693536
Volume :
11
Database :
Directory of Open Access Journals
Journal :
IEEE Access
Publication Type :
Academic Journal
Accession number :
edsdoj.3ac33d6c0a1f470790bee4ec7d22d342
Document Type :
article
Full Text :
https://doi.org/10.1109/ACCESS.2023.3241837