Back to Search Start Over

Scanning Probe Microscopy controller with advanced sampling support

Authors :
Miroslav Valtr
Petr Klapetek
Jan Martinek
Ondřej Novotný
Zdeněk Jelínek
Václav Hortvík
David Nečas
Source :
HardwareX, Vol 15, Iss , Pp e00451- (2023)
Publication Year :
2023
Publisher :
Elsevier, 2023.

Abstract

A low-cost Digital Signal Processor (DSP) unit for advanced Scanning Probe Microscopy measurements is presented. It is based on Red Pitaya board and custom built electronic boards with additional high bit depth AD and DA converters. By providing all the necessary information (position and time) with each data point collected it can be used for any scan path, using either existing libraries for scan path generation or creating adaptive scan paths using Lua scripting interface. The DSP is also capable of performing statistical calculations, that can be used for decision making during scan or for the scan path optimisation on the DSP level.

Details

Language :
English
ISSN :
24680672
Volume :
15
Issue :
e00451-
Database :
Directory of Open Access Journals
Journal :
HardwareX
Publication Type :
Academic Journal
Accession number :
edsdoj.38f653f90be043c5b1805757311d04a4
Document Type :
article
Full Text :
https://doi.org/10.1016/j.ohx.2023.e00451