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Defect Width Assessment Based on the Near-Field Magnetic Flux Leakage Method

Authors :
Erlong Li
Yiming Chen
Xiaotian Chen
Jianbo Wu
Source :
Sensors, Vol 21, Iss 16, p 5424 (2021)
Publication Year :
2021
Publisher :
MDPI AG, 2021.

Abstract

Magnetic flux leakage (MFL) testing has been widely used as a non-destructive testing method for various materials. However, it is difficult to separate the influences of the defect geometrical parameters such as depth, width, and length on the received leakage signals. In this paper, a “near-field” MFL method is proposed to quantify defect widths. Both the finite element modelling (FEM) and experimental studies are carried out to investigate the performance of the proposed method. It is found that that the distance between two peaks of the “near-field” MFL is strongly related to the defect width and lift-off value, whereas it is slightly affected by the defect depth. Based on this phenomenon, a defect width assessment relying on the “near-field” MFL method is proposed. Results show that relative judging errors are less than 5%. In addition, the analytical expression of the “near-field” MFL is also developed.

Details

Language :
English
ISSN :
21165424 and 14248220
Volume :
21
Issue :
16
Database :
Directory of Open Access Journals
Journal :
Sensors
Publication Type :
Academic Journal
Accession number :
edsdoj.37871d9114e94962bbbe7da49b7f8164
Document Type :
article
Full Text :
https://doi.org/10.3390/s21165424